陽明交大電子吳添立 | 半導體教學 | WLab

@wlab4650

47 tuit · page 1/2

Formal & Physical Sciences Engineering & Technology

TDDB Lifetime: Acceleration Models & Case Studies in GAA, Ferroelectric, SiC, GaN Devices | 2026 L9

Prof. Tian-Li Wu

November 3, 2026 55 min

★ ★ ★ ★ ☆ 4/5

TDDBSemiconductor ReliabilityAcceleration Models

Formal & Physical Sciences Engineering & Technology

PN Diode Current Transport and Schottky Barrier Fundamentals | 2026 L9

Prof. Tian-Li Wu

November 2, 2026 113 min

★ ★ ★ ★ ☆ 4/5

PN JunctionSemiconductor PhysicsSchottky Barrier

Applied Sciences & Engineering Engineering & Technology

Time-Dependent Dielectric Breakdown: Mechanisms, Weibull Analysis, and Percolation Model | 2026 L8

Prof. Tian-Li Wu

October 27, 2026 118 min

★ ★ ★ ★ ☆ 4/5

TDDBDielectric BreakdownSemiconductor Reliability

Formal & Physical Sciences Engineering & Technology

Inside the PN Junction: Depletion, Built-In Potential & Breakdown | 2026 L7

Prof. Tian-Li Wu

October 21, 2026 83 min

★ ★ ★ ★ ★ 5/5

PN JunctionSemiconductor PhysicsDepletion Region

Formal & Physical Sciences Engineering & Technology

Why Threshold Voltage Shifts in MOSFETs: Interface charges & Bias Temperature Instability | 2026 L7

Prof. Tian-Li Wu

October 20, 2026 159 min

★ ★ ★ ★ ★ 5/5

MOSFETBTIThreshold Voltage

Formal & Physical Sciences Engineering & Technology

Excess Carriers in Semiconductors: Lifetime, Ambipolar Transport & Quasi-Fermi Levels | 2026 L6

Prof. Tian-Li Wu

October 19, 2026 130 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsExcess CarriersCarrier Lifetime

Applied Sciences & Engineering Engineering & Technology

Semiconductor Reliability in Practice: Weibull Plots, System & Activation Energy | 2026 L6

Tian-Li Wu

October 13, 2026 91 min

★ ★ ★ ★ ☆ 4/5

Semiconductor ReliabilityWeibull DistributionSystem Reliability

Formal & Physical Sciences Engineering & Technology

From Doping to Current Flow: Carrier Concentration, Drift & Diffusion | 2026 L5

Prof. Tian-Li Wu

October 12, 2026 129 min

★ ★ ★ ★ ☆ 4/5

SemiconductorDopingCarrier Concentration

Formal & Physical Sciences Engineering & Technology

Predicting Semiconductor Lifetime with Weibull and Lognormal Statistics | 2026 L5

Prof. Tian-Li Wu (NYCU)

October 6, 2026 150 min

★ ★ ★ ★ ☆ 4/5

SemiconductorReliabilityWeibull

Formal & Physical Sciences Physics

From Quantum States to Carriers: Understanding Electron & Hole Concentrations | 2026L4

Tian-Li Wu

October 5, 2026 157 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsCarrier ConcentrationDensity of States

Formal & Physical Sciences Engineering & Technology

From Semiconductor Junctions to MOSFETs, Defects, and Yield Reliability | 2026 L4

陽明交大電子吳添立 | 半導體教學 | WLab

September 29, 2026 158 min

★ ★ ★ ★ ☆ 4/5

SemiconductorMOSFETPN Junction

Applied Sciences & Engineering Engineering & Technology

Semiconductor Failure Transitions, Arrhenius Equation, Failure Time, and Band Theory | 2026 L3

Prof. Tian-Li Wu (陽明交大電子吳添立)

September 23, 2026 138 min

★ ★ ★ ★ ☆ 4/5

Semiconductor ReliabilityArrhenius EquationBand Theory

Formal & Physical Sciences Physics

Quantum Mechanics for Semiconductor Devices: Tunneling, Wave Functions, and Energy Bands | 2026 L3

Prof. Tian-Li Wu

September 21, 2026 150 min

★ ★ ★ ★ ★ 5/5

Quantum MechanicsSemiconductor DevicesTunneling

Applied Sciences & Engineering Engineering & Technology

Overview of Semiconductor Reliability Challenges and Basic Concepts | 2026 L2

Prof. Tian-Li Wu (WLab, National Yang Ming Chiao Tung University)

September 15, 2026 151 min

★ ★ ★ ★ ☆ 4/5

Semiconductor ReliabilityBias Temperature InstabilityDielectric Breakdown

Applied Sciences & Engineering Engineering & Technology

From AI Power Challenges to Future Transistors and Crystal Structures | 2026 L2

Prof. Tian-Li Wu

September 14, 2026 135 min

★ ★ ★ ★ ☆ 4/5

SemiconductorTransistorAI Power

Formal & Physical Sciences Engineering & Technology

Why Semiconductor Reliability Matters: From TSMC N2 to Reliability & Failure Physics | 2026 L1

Prof. Tian-Li Wu

September 9, 2026 142 min

★ ★ ★ ★ ☆ 4/5

SemiconductorReliabilityTSMC

Formal & Physical Sciences Engineering & Technology

BJT Part2: Base width modulation, High Level Injection, Breakdown, Circuit Models | 2026 L13

Prof. Tian-Li Wu (陽明交大電子吳添立)

June 3, 2026 63 min

★ ★ ★ ★ ☆ 4/5

BJTSemiconductor PhysicsEarly Effect

Formal & Physical Sciences Engineering & Technology

Advanced CMOS Scaling: FinFET to GAA and CFET | 2026 L14

Prof. Tian-Li Wu

June 3, 2026 75 min

★ ★ ★ ★ ☆ 4/5

CMOSFinFETGAA

Formal & Physical Sciences Engineering & Technology

BJT Part1: NPN Operation, Minority Carrier Distribution & What Controls Current Gain | 2026 L12

Prof. Tian-Li Wu

June 1, 2026 141 min

★ ★ ★ ★ ☆ 4/5

BJTSemiconductor PhysicsTransistor

Formal & Physical Sciences Engineering & Technology

MOSFET Part 2: Basic Operations and Key Advanced Concepts| 2026 L11

Prof. Tian-Li Wu

May 18, 2026 170 min

★ ★ ★ ★ ☆ 4/5

MOSFETSemiconductor PhysicsDevice Operation

Formal & Physical Sciences Engineering & Technology

MOSFET Part 1: Band Diagrams, Threshold Voltage, C–V | 2026 L10

Prof. Tian-Li Wu

May 11, 2026 126 min

★ ★ ★ ★ ☆ 4/5

MOSFETSemiconductor PhysicsBand Diagram

Formal & Physical Sciences Engineering & Technology

Diode Current, Contacts & the Road to MOSFET: PN Current, Ohmic vs Schottky & MOS Capacitor | 2026L9

Prof. Tian-Li Wu

May 4, 2026 152 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsPN JunctionSchottky Barrier

Formal & Physical Sciences Engineering & Technology

PN Junction : Built-In Potential, Depletion Width, Reverse Bias, Breakdown, Diode Current | 2026L8

Prof. Tian-Li Wu

April 20, 2026 162 min

★ ★ ★ ★ ☆ 4/5

PN JunctionSemiconductor PhysicsDepletion Region

Formal & Physical Sciences Engineering & Technology

Excess Carriers, Recombination, PN Junction: From Ambipolar Transport to Interface Trapping | 2026L7

Prof. Tian-Li Wu

April 13, 2026 83 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsExcess CarriersRecombination

Formal & Physical Sciences Physics

How Electrons & Holes Move: Drift, Diffusion, Scattering & Excess Carrier Dynamics | 2026 L6

Prof. Tian-Li Wu

April 1, 2026 117 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsCarrier TransportDrift

Formal & Physical Sciences Physics

Carrier Concentration, Intrinsic vs Extrinsic Semiconductors & Fermi Level Explained | 2026 L5

Prof. Tian-Li Wu

March 30, 2026 149 min

★ ★ ★ ★ ☆ 4/5

Semiconductor PhysicsCarrier ConcentrationFermi Level

Formal & Physical Sciences Physics

From Quantum Tunneling to Energy Bands: Schrödinger Equation, Band & Fermi-Dirac Statistics| 2026 L4

Prof. Tian-Li Wu

March 16, 2026 157 min

★ ★ ★ ★ ☆ 4/5

Quantum MechanicsSemiconductor PhysicsEnergy Bands

Applied Sciences & Engineering Engineering & Technology

From Crystal to Quantum Tunneling: Why We Need Quantum Mechanics for Modern Transistors | 2026 L3

Prof. Tian-Li Wu

March 9, 2026 143 min

★ ★ ★ ★ ☆ 4/5

SemiconductorQuantum MechanicsMiller Index

Applied Sciences & Engineering Engineering & Technology

From FinFET to CFET: Semiconductor Roadmap, Materials & Device Junctions | 2026 L2

Prof. Tian-Li Wu

March 2, 2026 155 min

★ ★ ★ ★ ☆ 4/5

SemiconductorFinFETCFET

Applied Sciences & Engineering Engineering & Technology

Semiconductor From Transistors to Trillions: Course Intro, MOSFETs, Moore's Law | 2026 L1

Prof. Tian-Li Wu

February 23, 2026 171 min

★ ★ ★ ★ ☆ 4/5

SemiconductorMOSFETMoore's Law

Applied Sciences & Engineering Engineering & Technology

2025 L13: Electrostatic discharge (ESD) (2)

Tian-Li Wu (吳添立)

December 8, 2025 50 min

★ ★ ★ ★ ☆ 4/5

ESDSemiconductor ReliabilityProtection Circuits

Applied Sciences & Engineering Engineering & Technology

2025 L12: Electrostatic discharge (ESD) (1)

Tian-Li Wu

December 3, 2025 109 min

★ ★ ★ ★ ☆ 4/5

ESDSemiconductor ReliabilityLatch-Up

Applied Sciences & Engineering Engineering & Technology

2025 L11: Mass Transport Induced Failures (2)

Tian-Li Wu (吳添立)

November 24, 2025 59 min

★ ★ ★ ★ ☆ 4/5

ElectromigrationSemiconductor ReliabilityInterconnects

Applied Sciences & Engineering Engineering & Technology

2025 L10: Mass Transport Induced Failures (1)

陽明交大電子吳添立 | 半導體教學 | WLab

November 20, 2025 95 min

★ ★ ★ ★ ☆ 4/5

Semiconductor ReliabilityElectromigrationMass Transport

Applied Sciences & Engineering Engineering & Technology

2025 L9: Time dependent dielectric breakdown (2)

Tian-Li Wu (吳添立)

November 10, 2025 61 min

★ ★ ★ ★ ☆ 4/5

TDDBSemiconductor ReliabilityDielectric Breakdown

Applied Sciences & Engineering Engineering & Technology

2025 L8: Interface charges and Bias Temperature Instability (2)/Time dependent dielectric breakdown

Tian-Li Wu (吳添立)

November 3, 2025 174 min

★ ★ ★ ★ ☆ 4/5

SemiconductorReliabilityInterface Traps

Applied Sciences & Engineering Engineering & Technology

2025 L7: Interface charges and Bias Temperature Instability (1)

Tian-Li Wu

October 27, 2025 141 min

★ ★ ★ ★ ☆ 4/5

SemiconductorReliabilityMOSFET

Applied Sciences & Engineering Engineering & Technology

2025 L6: Mathematics of Failure-and-Reliability(2)

Tian-Li Wu (吳添立)

October 21, 2025 158 min

★ ★ ★ ★ ☆ 4/5

ReliabilityLognormal DistributionWeibull Distribution

Applied Sciences & Engineering Engineering & Technology

2025 L5: Defects, Contaminants, Yields (2)/Mathematics of Failure-and-Reliability(1)

Tian-Li Wu (吳添立)

October 16, 2025 159 min

★ ★ ★ ★ ☆ 4/5

SemiconductorYield ModelingReliability

Applied Sciences & Engineering Engineering & Technology

[2025 short course] 5-3: SiC MOSFETs Interface Challenges/PBTI/HTRB/Switching

Prof. Tian-Li Wu

October 5, 2025 12 min

★ ★ ★ ★ ☆ 4/5

SiC MOSFETReliabilityInterface Traps